統計學術演講公告
統計碩士學位學程將於104年11月24日(星期二)舉辦統計學術演講，
邀請成功大學統計系鄭順林副教授蒞臨演講，講題為「Some applications of degradation models to reliability analysis」。
歡迎對於此議題有興趣的師生同仁參加。
講題：Some applications of degradation models to reliability analysis
講員：鄭順林 副教授 成功大學統計系
時間：2015年11月24日星期二 下午 3：00 ~ 5：00
地點：臺灣大學博雅教學館405講堂
費用：免費
名額：40位
摘要：
Degradation measurements may provide critical information about the device reliability when one would expect few or even no failures during a study. Continuous degradation models, such as a general path, Gaussian process and Gamma process, have been applied to assess device reliability for decades in wearing, aging, and fatigue growth processes. On the other hand, in practical applications, discrete degradation processes have been also observed for years and are discussed again lately for leakage current of thin gate oxides of transistors in nano-technology, software fault-failure processes, and crack growth of metal fatigue. In this talk, I will present certain selected applications of these degradation models to assess device reliability.
活動報名網址：https://info2.ntu.edu.tw/register/flex/main.html?actID=2015C100_04&sesID=1
聯絡人：張仲凱
聯絡方式：E-mail：ntustat@ntu.edu.tw
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